TM 1-1520-265-23Equipment is standardized on a test block (reference block) which is constructed of a known material that contains knowngood areas, and either simulated or actual defects of known size. The response of the equipment (eddy current machineand probe) to the good material is set as the starting point by nulling the equipment on the sound area of the block. Bythis action, all subsequent readings represent deviations from the null point and have both magnitude and direction.Careful manipulation of the controls allows the operator to separate the response (deviation from the null point) for lift-offand flaw (geometric) effects.Shielded probes have a cylinder of material which encircles the coil of the probe. This serves to constrict the probes fieldand, therefore, reduces the spread of eddy currents beyond the probe's diameter. This concentrated electrical field ismost useful for scanning around fasteners, near edges, and into specific small areas. Other types of probes are used forwide area scans, alloy sorting, conductivity comparisons, coating thickness comparisons, skin thickness comparisons,etc.1.4.11.1Safety Precautions During Eddy Current Inspection . Follow safety precautions and instructionscontained in this manual and the Nondestructive Inspection Methods manual listed in Table 1-1.WARNINGElectrical equipment shall not be operated in areas where combustible gases or vapors may bepresent, unless the equipment is explosion-proof.1.4.11.2Eddy Current Scanning Techniques.Eddy current inspection is performed by moving the probe over andas close as possible to the surface of the area of interest. If the coil(s) pass over a defect like a crack, the impedance ofthe coil will change and be represented as a movement of the "flying spot." Before beginning the inspection, the operatorwill have separated the response from lift-off and from a flaw by using the test block and manipulating the controls.Therefore, the crack response will be essentially similar to the response from the known defect and different from theresponse from lift-off. Microprocessor controlled instruments have the ability to store responses in memory. Such storedresponses are an invaluable teaching aid.1.4.11.2.1Scanning Around Fasteners, Inserts, and Edges of Parts. Shielded probes are recommended any timethat the pattern the eddy current field is likely to extend out such that it comes in contact with a feature which would maskthe response from a defect. Such features may include edges, fasteners, dissimilar materials attached to the test piece,etc. An unshielded probe can be used around such features, but the effect of those features must be made constant bykeeping the distance between the probe and the feature constant. Non-conductive mechanical guides (straight edges,plugs, spacers, etc.) can be used to maintain a constant distance. In fact, the use of non-conductive mechanical guidesis useful for shielded and unshielded probes alike. As operators gain experience, they become quite innovative inmaking guides that maintain constant lift-off, angles, and distance from features which may mask flaw indication.Common materials for mechanical guides are plastic (polyethylene, acrylic, and polycarbonate), wood, phenolicimpregnated material, and resins for casting into shapes (epoxy, polyester, or hot glue). Careful selection of probes andconstruction of suitable mechanical guides will make possible inspection of problem areas such as sharp edges, tightradii, small openings, and areas near potentially masking features.1-32
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